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Helping Solve Processing and Materials
 Problems using Scanning Probe
Microscopy since 1990
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Products and services for AFM, STM, and SEM
Applications of AFM and STM
   CD
   DVD
   HD-DVD
   Blu-Ray
   Hard Disks
   Magnetic Tape
   More
   Pharmaceutical materials
   Polymer molecules
   Orthopedic implants
   Opthamalic Devices
   Diagnostic devices
   And More
   Powders
   Naturally occurring (cellulose)
   Blends
   Copolymers
   Homopolymers
   Material domains
   Paper
   Packaging materials
   Cast, extruded, or molded polymers
Coatings
   Paint
   Paper finishing
   Can coatings
Electronic Materials
   Silicon
   Silicon Carbide
   Germanium
   Gallium Arsenide
   Wafers
   Thin Films
Automotive
   Corrosion
   Wear
Energy Technologies
   Corrosion
   Calalysts
New materials including ultra high strength magnets
Optics & Photonics
   Diffraction Gratings
   Modified surfaces
   superpolished optics
   Ultrasmooth surfaces
   IR
   Visible Light
   UV
   X-Ray
Telecommunications

Metals

Gallery of interesting images

Links

 

Simple AFM Images of Aluminum Foil

AFM Analytical Services

AFM, STM, Electric and Magnetic Force and other Scanning Probe techniques.

We are early pioneers of Phase imaging.

About AFM

 

AFM image of one of our calibration references/standards

Calibration Specimens

Length calibration specimens in the nanometer to micron range for AFM, STM, SEM, and others.

We also offer Traceable Calibration Specimens (XY length scales traceable to international standards)

Other supplies

 

Screen-shot of our DiscTrack Plus Media Measurement System

Calibration and Measurement Software

DiscTrack Plus, SPIP, and DTP Advanced Image Processor

 

Our President, Dr. Donald A. Chernoff

Training, Consulting, and Expert Services

Put our AFM experience to work for you.

 

About Advanced Surface Microscopy, Inc.
News and announcements

NanoScope Dimension Microscope

Buy and Sell used Nanoscopes

Convert your excess assets into cash or come to us for quality refurbished AFMs at bargain prices.  We buy and sell DimensionTM, MultimodeTM, and Small sample AFM and STM, Microscopes, Scanners, PC's, and Controllers (made by Bruker Nano, formerly known as Veeco Metrology and as Digital Instruments).

 

Repair your NanoScope AFM or STM

We can perform many repairs on older NanoScope Brand Atomic Force Microscopes.

Now:  Z drift repair

 

Industries served and materials analyzed:
Atomic Force Microscopy (AFM) is an important analytical tool in science and industry.  It's one of the key metrology (measurement) tools used in Nanotechnology, in the semiconductor industry, in optical discs (CD, DVD, Blu-Ray, etc.), in magnetic media, and in many other fields.  AFM is used to analyze surface finishes and roughness, material wear, corrosion, and other surface structures.  It can be used to map material domains in polymers, crystal structures in metals, particle size and distribution, formed micro and nano-structures, structure and size of catalyst and other powders, fibers of all types, pharmaceutical materials, and many other things.  We've analyzed everything from the microroughness of superpolished optics to atomic steps on semiconductor wafers, from DNA molecules to polymer blends used in food packaging, from the sharpness of razor blades to wear patterns on piston rings and the shape of liquid droplets, from the size of nanomedicines to the track pitch variation of Blu-Ray discs.

Any surface you can touch is a potential object for study

Techniques we have available include TappingMode height and phase imaging, Scanning Tunneling Microscopy (STM), Nano indenting and scratching, Electric and Magnetic Force Microscopy (EFM and MFM), Scanning Kelvin Probe Microscopy (Surface Potential), Scanning Capacitance Microscopy (SCM), Scanning Spreading Resistance Microscopy (SSRM) and other conductive AFM techniques.

Whether you need analysis, consultation or training to use your AFM equipment better, supplies and accessories, traceable calibration standards, NanoScope equipment or equipment repairs, contact us.  We can help.

 

 

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