Advanced Surface Microscopy, Inc.

Helping Solve Processing and Materials  Problems using Scanning Probe Microscopy since 1990.

AFM, STM, EFM, LFM, MFM, Tapping Mode, Chemical Phase Imaging, SPM Calibration, liquid work, Nano-Indentation, Nano-Scratching, Surface Potential (Scanning Kelvin Probe) Imaging, DiscTrack Plus, MagneTrack, Traceable Calibration Specimens, Force Volume Imaging. Used NanoScopes.  Intellectual Property. AFM Probes. Expert Testimony. ASM is Advanced Surface Microscopy.

What we can do for you:

The Problem:

What you can't see can hurt you.  Device, product, or material performance is affected by characteristics such as surface finish, and the size, shape, and position of fabricated features and material domains.

The Solution:

We use Atomic Force Microscopy (AFM) to capture high resolution, three-dimensional images of the surface structure of any solid and some liquids.  In addition to recording the microscopic shape of the surface, the AFM can sense material properties such as stiffness, adhesion, and friction as well as magnetic and electric fields.  This gives you information to improve process quality, speed product development and enhance research.

What used to be unknown, and therefore uncontrolled, is now within your grasp.

Products and Services:

Customers and Application Areas:

Most of our customers work in industry, government facilities and universities as scientists, engineers and manufacturing technologists. Some are independent consultants or attorneys working on Intellectual Property matters (IP). A few are bankers, leasing or finance agents, or material, property, purchasing, or asset-disposal managers seeking to convert idle assets (such as used scientific equipment) into cash. 

Regardless of the work environment, the common theme of our interaction is the application of Atomic Force and Scanning Probe Microscopy to get answers and solve problems. We have helped customers who work on a very wide range of technologies, materials, processes and research topics.  Here are some of the key areas:

In summary, the scope of applications is such that any surface you can touch is a potential candidate for study and any manufacturing industry can potentially benefit from Atomic Force Microscopy (AFM).


Miscellaneous topics

Advanced Surface Microscopy, Inc.

3250 N. Post Rd., Suite 120
Indianapolis, IN  46226 USA
Phone: +1-317-895-5630
Toll Free: 1-800-374-8557 (US & Canada)
FAX:  +1-317-895-5652

default.htm last updated 05/20/2014 by DLB

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