Biography
David Burkhead was educated at the University of Akron (B.S. Physics, 1997) and is studying for a master's degree in Physics at IUPUI. He has worked at Advanced Surface Microscopy, Inc. since 1997, providing distinguished SPM analyses and software development.
See David's personal web page.
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Advanced Surface Microscopy, Inc.3250 N. Post Rd., Suite 120 |
chernoff.htm last updated 04/09/2007