ASM news and announcements

Dr. Donald A. Chernoff will present a general interest lecture on applications of Scanning Probe Microscopy.

Title: Scanning Probe Microscopy "at the Shopping Mall" (see abstract below)

Location:

McCrone Research Institute
2820 S. Michigan Ave.
Chicago, Illinois
312-842-7100

Host: State Microscopical Society of Illinois
Date: Friday, Sept. 20, 1996
Time: Dinner is 6PM. Lecture is 7PM.
A light dinner (pizza and refreshments) will be served at 6PM. If interested in dinner, please phone Lori Krumick at McCrone by Wednesday, September 18 to make a reservation (cost is about $6).

Abstract:

All forms of microscopy touch our daily lives by supporting manufacturing, engineering and research. The Scanning Tunneling Microscope originally gained attention as a simple device for imaging atoms. From that exotic beginning, there has grown a family of Scanning Probe Microscopes. These instruments can operate in air, in liquid and in vacuum. They record 3-dimensional topography, magnetic and electric fields, friction, adhesion, stiffness, optical spectra and more. This talk presents applications of Scanning Probe Microscopy to a variety of materials and devices used in consumer products, including electronics, data storage, food packaging and engines.


Don Chernoff 

Advanced Surface Microscopy, Inc.

3250 N. Post Rd., Suite 120
Indianapolis, IN  46226 USA
Phone: +1-317-895-5630
Toll Free: 1-800-374-8557 (US & Canada)
FAX:  +1-317-895-5652
http://www.asmicro.com
e-mail: info@asmicro.com

 
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mccrone.htm last updated 04/09/2007

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