• Don Chernoff will be presenting a poster at SPIE Advanced Lithography Feb. 25, 2008.  Picometer-scale accuracy in pitch metrology by optical diffraction and atomic force microscopy
• ASM exhibits at Materials Research Society, Boston Mass.  Nov29-Dec1, 2005. 
  Advanced Surface Microscopy Inc. is exhibiting products and services related to Atomic Force/Scanning Probe Microscopy.  We provide analytical services, nanometer-scale calibration specimens, probe tips, high accuracy measurement software, and training.  We buy, refurbish, sell and install NanoScope/Veeco/Digital Instruments AFMs.  
  See us at booth 824, shared with Applied NanoFluorescence.
  
• 6/13/00-6/15/00 - Replitech North America in Miami, Florida
• 5/14/00 - Don Chernoff will be presenting a poster on automated measurement of feature geometry in various optical disc media at the Optical Data Storage convention in British Columbia, Canada
• 2/22/00-2/24/00 - Advanced Surface Microscopy, making their first appearance at RepliTech Europe in Dusseldorf Germany, release DiscTrack Plus version 3.4
• 6/08/99-6/10/00 - Advanced Surface Microscopy, making their first appearance at RepliTech North America, release DiscTrack Plus version 3.2
• 1/15/99 DiscTrack Plus, version 3.0 is released
• 10/18/98 - Don Chernoff will discuss automation improvements in SPM in a presentation at the Nov. '98 AVS meeting and at the Oct., 1998 MOMS seminar
• 10/18/98 -Second Patent issued to ASM for measurement techniques
•  1/19/98 - Historical note about Pittcon symposium on Scanning Tunnelling Microscopy in Feb 1988.
•  2/6/97 - ASM announces availability of DiscTrack version 2.4 and Calibrator Pro 2.3.

10/23/96 - An ASM image is chosen for the 1997 Digital Instruments calendar.

•  10/8/96 - Advanced Surface Microscopy announces new products and services
•  10/8/96 - Don Chernoff will make two presentations at the Oct. '96 AVS meeting
•  10/8/96 - Don Chernoff will present an invited talk at the Eastern Analytical Symposium.
•  9/5/96 - Don Chernoff will present a general interest lecture on applications of Scanning Probe Microscopy at the September meeting of the State Microscopical Society of Illinois

Advanced Surface Microscopy, Inc. 3250 N. Post Rd., Suite 120 Indianapolis, IN  46226 USA Phone: +1-317-895-5630 Toll Free: 1-800-374-8557 (US & Canada) FAX:  +1-317-895-5652 http://www.asmicro.com e-mail: info@asmicro.com

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news.htm last updated 02/07/2008 .

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