Expert services and Litigation support
Patent infringement matters
In manufactured products, infringement of structural, composition and process patents can often be revealed by microscopic examination of the material or device. We look at the structure to see what it is (for comparison with a designed structure) and to see what it says about the process that formed the structure. The AFM is used to examine surfaces (either normal external surfaces or interior structures revealed by delamination, cutting, etc.) and near-surface forces. When 3-dimensional structures are involved, when roughness is an issue, when contaminants are suspected, when electric or magnetic fields are present, and in many other situations, Atomic Force Microscopy (AFM) can provide unique insights.
Our casework experience relates to
some of the following industries: Aerospace, Automotive, BioMedical,
Chemicals, Data Storage, Electronics, Energy, Metals, Nanotechnology, New
Materials, Optics, Paper, Pharmaceuticals, Photonics, Scientific and
Measurement Instruments, Semiconductor,
Telecommunications, and more.
Some confidential cases are not listed
In a closed case involving optical discs, Don
Chernoff (Advanced Surface Microscopy, Inc.) was appointed as a neutral expert
by the Federal district court judge to provide calibrated 3-dimensional AFM
images showing the size and shape of data marks. In 2003, the case was settled for $1.4
million. Optical Disc
Corporation v. Del Mar Avionics, 208 F.3d 1324 (Fed. Cir. 2000).
In an ongoing case involving optical discs, Don
Chernoff (Advanced Surface Microscopy, Inc.) has provided calibrated measurements of the size, shape and position
of 3-dimensional structures. Measurements were made with our
proprietary DiscTrack Plus(TM)
software.
Testimony
Some confidential cases are not listed.
Other AFM Applications
In addition to the casework examples above, there are literally hundreds of other established, well-accepted AFM applications, and more are waiting to be discovered. Please see a partial list of materials and devices we have personally examined and please explore the rest of our web site. Wondering whether we can help you win your case? Just ask.
We know our limits
No analytical instrument has unlimited application. We know what AFM can and can't do and when it is being misused. When opposing parties have AFM experts of their own, it can't hurt that we "helped write the book" on limitations of this technique. Finally, we know when other techniques can be used to complement AFM and make a more complete picture.
Communication is Important to us
"Atomic Force Microscope" sounds exotic, doesn't it? It really isn't. Working with hundreds of clients has taught us ways to express how AFM works and what AFM does in simple, concise terms, drawing appropriate analogies to everyday experiences. We are skilled at organizing data and presenting images that accurately support and illustrate our conclusions. We use the ReadyCast web collaboration service to hold truly interactive meetings that speed understanding.
Related Links
Corporate
Overview
Don Chernoff photo
and bio
Don Chernoff resume
Don Chernoff publication
list
updated 04/09/2007