Advanced Surface Microscopy (ASM) president Don Chernoff, Ph.D, has been a leader in scanning probe/atomic force microscopy since its inception. His technical papers on applied microscopy have been published worldwide. Don's industrial focus is on reducing costs by improving quality through microscopy. To meet customer demand for high precision measurements, Dr. Chernoff invented DiscTrack Plus in 1995.
ASM has been serving the optical disc industry since 1990, offering SPM supplies, on-site consultation and training, AFM purchase liason, and mail-in analytical services for masters, stampers, replicas, and discs.
Our Customers Say: DiscTrack Plus Improves Quality, Saves Money, Saves Time
| Advanced Surface Microsocopy, Inc. has provided Atomic Force/Scanning Probe Microscopy services to industry since 1990. The DiscTrack Plus track pitch measurement system has been featured in One to One Magazine | DiscTrack Plus includes technology protected by US Patents #5,644,512 and 5,825,670. DiscTrack, DiscTrack Plus, and FeatureFinder are trademarks of Advanced Surface Microscopy, Inc. NanoScope is a registered trademark and Dimension and MultiMode are trademarks of Digital Instruments, Inc. Autoprobe® is a registered trademark and Accurex™ is a trademark of ThermoMicroscopes, Inc. |
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Advanced Surface Microscopy, Inc.3250 N. Post Rd., Suite 120 |
newbrochure12.htm last updated 04/09/2007