How consistent is your production process? What effect do the geometric properties of DVD and CD features have on the playability of your discs? What effect do changes to production processes have on those geometric properties? Now you can find out.
Disc analyzers provide electrical playback measurements which are very useful in optical disc quality control, but they cannot provide a geometric measure of each individual feature. Scanning Probe Microscopes (SPMs) can provide that measure but the time required to make each measurement has limited the analysis to a handful of features at a time. DiscTrack™ Plus, with its automated feature location and measurement system, unleashes your SPM. Now, you can obtain accurate and precise measurements of hundreds of features in scant minutes. With just a few clicks of a computer’s mouse, it is possible to know the length, width, height, and angles of the sidewalls and endwalls of every feature in up to 20 SPM images at a time. That’s up to several thousand features, each individually measured in location, size, and shape. Statistical summaries of each of 14 separate geometric parameters are provided. In addition, each individual feature is listed and uniquely identified.
Graphing parameters is easy. Want to know how the widths of features varies with length? A few seconds will tell you in a clear, easy-to-interpret, graphical form. Is a measured parameter outside the norm? Double-click on the point in the graph and see the image itself with the feature identified so you can see what, exactly, is causing the anomaly.
Do you work with stampers and masters or replicas so that you need to work with both bumps and pits? DiscTrack Plus handles measurement of bumps and pits with equal ease. Do you work with continuous ridge or groove media such as CD-R? DiscTrack Plus can provide measurements at multiple locations along each track. Are you concerned about track pitch? DiscTrack Plus provides the same fast, accurate measurement of track pitch as that provided by the older DiscTrack system, but now in a convenient, easy to use, Windows 95/NT format.
By directly measuring the shape, size, and location of features, DiscTrack Plus™ sharpens your process control. When feature geometry is measured precisely, for statistically significant numbers of features, it becomes more clear which production variables determine particular characteristics. Process windows and tolerances can be established. One can systematically study the effects of feature geometry on various electrical signals. By reducing uncertainty in process optimization, DiscTrack Plus™ will help you produce higher quality discs at lower cost.
Parameters measured by DiscTrack Plus™:
Feature position.
Widths near top and bottom and at a user-selected threshold
Lengths near top and bottom and at a user-selected threshold
Side and end wall slopes
Heights measured across and along the track
Track pitch
All horizontal distances are corrected for scanner non-linearity and mis-calibration.
|
Track |
4 |
6 |
|
Feature |
4 |
1 |
|
Width at Threshold(nm) |
319.86 |
347.35 |
|
Length at Threshold(nm) |
463.29 |
414.50 |
|
Crosswise Height(nm) |
94.45 |
104.46 |
|
Lengthwise Height(nm) |
92.80 |
100.02 |
|
Left Angle (deg) |
35.83 |
38.37 |
|
Right Angle (deg) |
37.48 |
41.81 |
|
Front Angle (deg) |
28.84 |
28.82 |
|
Back Angle (deg) |
26.77 |
28.57 |
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Advanced Surface Microscopy, Inc. has provided Scanning Probe Microscopy services to industry since 1990. The DiscTrack™ track pitch measurement system has been featured in One to One magazine. DiscTrack™ and DiscTrack Plus™ include technology covered under US Patents #5,644,512 and 5,825,670. DiscTrack™ and DiscTrack Plus™ are trademarks of Advanced Surface Microscopy, Inc.
To improve disc quality, please contact:
 |
Advanced Surface Microscopy, Inc.3250 N. Post Rd., Suite 120 |
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pitgeom.htm last updated 04/09/2007 .