Model 750-HD

High Durability Calibration Reference Specimen for AFM and STM

Nominal pattern dimensions:
Pitch 750 nm
Height 100 nm

Nominal specimen dimensions:  6.35 mm diameter, 0.3 mm thick.

Composition: solid Nickel

Supplied unmounted.
Can be used for AFM, STM and SEM.  Has been used successfully in a hot water AFM.

This Calibration Reference specimen comes with a non-traceable, manufacturer’s certificate. This states the average period, based on batch measurements.

750-HD

4 micron scan, AFM image. (rendered in slope mode)

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this file updated 04/09/2007 DC.
 

 

 

 

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