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Tools for NanoTechnology Nanometer Calibration and Test Specimens
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301BE |
![]() (3x3 um AFM scan) *new* 150-2D |
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We also sell traceable calibration
standards
See an example of long-term calibration drift. |
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Application |
Product |
Pattern |
Approx. |
Material |
Mounting |
Remarks |
Price (USD) |
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AFM,SEM*, TOF-SIMS, Auger, Surface Potential, other material contrast techniques. NSOM. |
150-1D |
Parallel ridges |
144 |
Al lines on Glass |
unmounted or on steel disk |
use contact or tapping mode. *may require customer-deposited coating for SEM or Auger use. |
$ 550 |
| AFM, SEM, Auger, STM | 150-2D | Array of Posts | 144 | Al on Si | unmounted or on steel disk | AFM: use contact or tapping mode. SEM works well with no charging |
$ 950 |
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AFM |
300-1D |
Parallel ridges |
288 |
W-coated Photoresist on Si |
15 mm steel disk |
use contact or TappingMode. |
$ 450 |
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AFM |
300-2D |
Array of Posts |
292 |
W-coated Photoresist on Si |
15 mm steel disk |
use TappingMode |
$ 900 |
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AFM,SEM |
302-edu |
Array of Posts |
292 |
W-coated Photoresist on Si |
unmounted |
student grade. has high density of random scratches. use TappingMode |
$ 350 |
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AFM |
700-1D |
Parallel ridges |
700 |
W-coated Photoresist on Si |
15 mm steel disk |
use contact or TappingMode |
$ 350 |
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AFM |
700-2D |
Array of Posts |
700 |
W-coated Photoresist on Si |
15 mm steel disk |
use TappingMode |
$ 700 |
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AFM,SEM, STM |
Array of flat bumps |
750 (X), Z (100) |
Ni |
unmounted |
High Durability: TappingMode, Contact Mode, STM, Liquid, High Temperature |
$ 250 |
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AFM Phase Imaging |
PT |
random hard and soft domains as small as 10 nm |
none |
polymer |
15 mm steel disk |
test resolution and build confidence in phase imaging |
$ 150 |
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AFM,SEM, TOF-SIMS, Auger, Surface
Potential, other material contrast techniques |
parallel ridges |
292 |
Ti lines on Si |
unmounted or on steel disk |
use contact or TappingMode |
$ 1,000 |
* A certificate accompanies each specimen giving the actual pitch value.
| Specimen | TappingModeTM | Contact Mode | STM | Liquid | High Temperature |
| 300-1D, 700-1D | Yes | Yes | No | No | No |
| 300-2D, 700-2D | Yes | No | No | No | No |
| 750-HD | Yes | Yes | Yes | Yes | Yes |
| PT | Yes | Yes | No | Yes | No |
| 150-1D, 301BE | Yes | Yes | No | Not yet tested | Not yet tested |
| 150-2D | Yes | Yes | Yes | Not yet tested | Not yet tested |
Specimens available unmounted, mounted on steel disks, or mounted on SEM mounts.
"The Model 150-2D calibration specimen arrived promptly and has already helped us identify a problem with one of our
AFMs."
- A. J. Katan, University of Leiden, The Netherlands
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This page last updated 11/15/2007
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