Special Sale Items
Digital Instruments contact mode and TappingMode(TM) scanners for the Large Sample Stage (LSS), manufactured in 1992 and 1993.
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| Contact mode scanner s/n LSAFM-139J. Price $750. | TappingMode scanner s/n LSTA-162J. Price $1250. |
The tapping Silicon Probes in this unique, research wafer have a wide range of force constants, about 30 to 230 N/m, measured by the "thermal method". Nearby probes probably have similar force constants, but we don't have a map showing variation across the wafer. The target specification for this wafer was k = 150 N/m, cantilever dimensions: length 125 um, width 35 um, thickness 6 um, however this is not guaranteed.
Suggested application: nanomechanical studies where a library of inexpensive, very stiff probes could be helpful. These probes can also be used for general purpose imaging.
Partial wafer containing more than 300 probes: Price: $1500.
Special price on a partial wafer containing more than 200 probes:
Price: $800.
If you're comfortable separating the individual probes, you'll save a lot of
money.
These model TESP probes have blunt tips but are perfect for mounting
nanotubes. Carbon nanotubes can be trimmed electrically due to the low
resistivity of the monolithic substrate and tip.
These probes can also be used for training new AFM users. Why drop a $40
probe when you can drop one of these?
Special sale price for quantities over 100 probes: $5/probe.
This is a savings of more than 50% compared with our regular price for practice
grade Si probes. While quantities last.
See our other probes, supplies and equipment.
updated 08/30/2007