| Item | Price |
| SPM Calibration Samples | |
| Model 150-1D Calibration specimen, 145 nm pitch, 1 dimension, Al on glass, supplied on steel disk or unmounted (die size is about 4x6 mm) | 583 |
| Model 150-2D Calibration specimen, 145 nm pitch, 2-dimensional array of bumps, Al on Silicon, supplied on steel disk or unmounted (die size is about 4x3 mm) | 1007 |
| Model 300-1D Calibration specimen, 288 nm pitch, 1 dimension | 477 |
| Model 300-2D Calibration specimen, 292 nm pitch, 2-dimension | 954 |
| Model 700-1D Calibration specimen, 700 nm pitch, 1 dimension | 371 |
| Model 700-2D Calibration specimen, 700 nm pitch, 2 dimension | 742 |
| Model 750-HD High durability calibration specimen with 750 nm pitch | 265 |
| Model 301BE Calibration specimen, 292 nm pitch, 1 dimension (Ti lines on Si) | 1060 |
| Model 145TC Traceable calibration specimen with 145 nm pitch (price includes select grade of model 150-1D plus Cert-1 Calibration) | $3233 |
| 150-2DUTC Traceable Calibration Specimen, 2-dimensional, 144 nm pitch (price includes select grade of model 150-2D plus Cert-2 Calibration) | $5777 |
| Model 292UTC Universal traceable calibration specimen with 292 nm pitch (price includes select grade of model 301BE plus Cert-1 Calibration) | $3710 |
| Test Specimens | |
| PT - Phase Imaging Test Specimen | 159 |
| Probes | |
| Silicon Nitride AFM Probes for contact mode or tapping in liquid | |
| SiN AFM probes, oxide-sharpened (box of 24 pcs), grade 1 | 340 |
| SiN AFM probes, oxide-sharpened, Grade 2 (box of 24 pcs) | 170 |
| SiN AFM probes, standard (box of 24 pcs), grade 1 | 192 |
| SiN AFM probes, standard, Grade 2 (box of 24 pcs) | 96 |
| SiN AFM probes, Cr-coated, grade 1, box of 24 pieces | 288 |
| SiN AFM probes, Cr-coated, grade 2, box of 24 pieces | 144 |
| Notes: | |
| Grade 1 probes have 4 tips per probe. | |
| Grade 2 probes have 1-3 tips per probe. | |
| Practice grade probes have 1-4 tips per probe and some of the tips have been used. | |
| Silicon AFM probes for Tapping Mode in Air | |
| Si AFM probes, standard type, (for an order of 5-20 pcs) (per probe) | 40 |
| Si AFM probes, standard type, for each piece over 20 pcs in a single order (per probe) | 24 |
| Example: 30 pcs. costs $1040 (20*40 + 10*24) | |
| Si AFM probes, practice grade (for an order < 90 pcs) | 11 |
| Si AFM probes, practice grade (for an order > 90 pcs) | 8 |
| Note: Our AFM Probes are similar to those described at www.VeecoProbes.com | |
| Sample Holders for Dimension AFM | |
| MV-1 Mini-vise | 1250 |
| SH-1 Stub holder (SEM and BEEM) | 500 |
| TT-1 Tilt Table | 1000 |
Minimum order requirements:
Terms:
We strongly encourage the use of credit cards for purchases under $1000. We accept the following Credit Cards:
Master Card (Eurocard), Visa, American
Express, Discover (Novus)
For orders over $1000, we will accept purchase orders with Net 30 days on approved credit.
F.O.B. our plant, Indianapolis.
All prices are in US Dollars.
Warranty: Supplies are sold with a 30-day
money-back guarantee. An additional parts and labor warranty may apply on
equipment, if stated on our quotation and invoice.
If a warranty is stated on our invoice, that warranty will apply.
No
other warranty applies.
To place an order, or request additional information, contact us at:
 |
Advanced Surface Microscopy, Inc.3250 N. Post Rd., Suite 120 |
Request information.