Precision Measurement of Optical Disc Media and More 

Optical Disc Media

DiscTrack Plus is a critical tool for testing optical discs. It reveals pit and groove geometry, track pitch, wobble, jitter and more. It is a crucial tool for the development of new formats, when disc players are scarce or unavailable. It is the perfect complement to electrical disc analyzers in process optimization and troubleshooting to support production.  DiscTrack Plus supports more than half the world's production of DVDs (as of 2007).

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• ISOM-ODS July 2005 technical presentation about HD-DVD mastering:
•     Poster:  AFM Analysis of HD-DVD Stampers (926 kB PDF)
•     3-page abstract: AFM Analysis of HD-DVD Stampers  (43 kB PDF)
• Read about surprising results in HD-DVD mastering. (92 kB PDF file) [brochure]
• DTP Advanced Image Processor, rescues noisy AFM images. (631 kB PDF file) [brochure]
• DVD-R wobble and pre-pit shape analysis. (469 kB Powerpoint file)
• Online brochure for DiscTrack Plus version 3.5  
• AFM file formats supported by DiscTrack Plus
• Original brochure for version 3.0 (187 kb PDF file)
• "AFM Length Analysis of Data marks:  Measuring Jitter, Asymmetry, Process Noise, and Process Position"--Presented at ODS2001 (Optical Data Storage Converence, Santa Fe NM, April 2001).  (82 kb PDF file) [technical presentation]
• "Measuring Size, Shape and Position of Pits and Grooves"--Presented at Replitech Hong Kong November 2000 (955 kb PDF file) [technical presentation] 
• "How to Save Money using AFM Analysis of Pits and Grooves" -- Presented at Media-Tech Oct. 21, 2003. (403 kb PDF file) [technical and marketing presentation]
• Media-Tech interview Oct. 21, 2003 [sales presentation]
• What our customers say about DiscTrack Plus 

Optical Gratings and Magnification Calibration Standards

• “Picometer-scale accuracy in pitch metrology by optical diffraction and atomic force microscopy”, [1 MB pdf file] Donald A. Chernoff, Egbert Buhr, David L. Burkhead, and Alexander Diener, to be presented at “Metrology, Inspection, and Process Control for Advanced Lithography XXII”, Monday 2/25/2008.
• NanoMetrology of Optical Gratings  (1MB pdf file) discusses pitch and orthogonality measurements on 2D gratings.  The demonstration measurements relate to an ongoing (2005) study of AFM calibration among several national standards labs. 

Magnetic Disk Media

Pre-patterned media ("Bit Patterned Media" and "Discrete Track Recording") are currently the subject of much research in the hard disk industry.  Pre-patterned media are analogous to optical disc media and DiscTrack Plus should be used to make very precise and accurate measurements from SEM and AFM images of the media masters, stampers or actual media. [updated 2/7/2008]

• "High Accuracy Measurements of Patterned Media", [590 kB pdf file] poster presented at DiskCon, September, 2007.  See also  “Picometer-scale accuracy in pitch metrology by optical diffraction and atomic force microscopy”, [1 MB pdf file], which gives further discussion of our accuracy claims.  

Read about MagneTrack.  The tool for measuring track pitch, bit placement and amplitude jitter in MFM images.

• Online brochure for MagneTrack
  

Future and Recent Conferences and Trade Shows:

• SPIE Advanced Lithography - poster presentation 2/25/2008.

• Diskcon, Santa Clara, CA.  9/19-20/2007.  Exhibit and poster presentation.

  Materials Research Society, Boston. Nov.29-Dec.1, 2005.   Booth 824, shared with Applied Nanofluorescence.
  Media-Tech Showcase and Conference, Frankfurt Germany, Oct. 4-5, 2005.  Stand L11.
  ISOM/ODS (Optical Data Storage). Honolulu. July 10-14, 2005.
  Media-Tech Expo, Las Vegas.  May 10-12, 2005.  Booth 11.011

• Forensic Sciences Symposium, Indianapolis.  January 24, 2005.

• Entertainment Media Expo/Media-Tech Showcase.  Hollywood, California.  August 31-Sept.1, 2004.   

• Media-Tech Exposition, Frankfurt, Germany.  May 25-27, 2004.  Stand 3.0 H30

• Media-Tech Showcase and Conference, Frankfurt, Germany October 2003

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updated 02/07/2008

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