ASM LOGO

Helping Solve Processing and Materials  Problems using Scanning Probe Microscopy since 1990.

 CD stamper bumps, perspective view

 

 CONTACT US:
Phone:  1-800-374-8557  Fax: 1-317-895-5652
e-mail: info@asmicro.com

Search this site.

Contents

Home
: Products and services for AFM, STM, and SEM
: Applications of AFM and STM
   : CD
   : DVD
   : HD-DVD
   :Blu-Ray
   : Hard Disks
   : Magnetic Tape
   : More
: Pharmaceutical materials
     : Collagen fibers
     : Collagen monomers
     : DNA Plasmids
   : Polymer molecules
   : Orthopedic implants
   : Opthamalic Devices
   : Diagnostic devices
   : And More
   : Powders
   : Naturally occurring (cellulose)
   : Blends
   : Copolymers
   :Homopolymers
   : Material domains
   : Paper
   : Packaging materials
   : Cast, extruded, or molded polymers
: Coatings
   : Paint
   : Paper finishing
   : Can coatings
: Electronic Materials
   : Silicon
   : Silicon Carbide
   : Germanium
   : Gallium Arsenide
   : Wafers
   : Thin Films
: Automotive
   : Corrosion
   : Wear
: Energy Technologies
   : Corrosion
   : Calalysts
: New materials including ultra high strength magnets
: Optics & Photonics
   : Diffraction Gratings
   : Modified surfaces
   : superpolished optics
   : Ultrasmooth surfaces
   : IR
   : Visible Light
   : UV
   : X-Ray
: Telecommunications

: Metals

:Gallery of interesting images

:Links

 

Simple AFM Images of Aluminum Foil
AFM Analytical Services

AFM, STM, Electric and Magnetic Force and other Scanning Probe techniques.

We are early pioneers of Phase imaging.

About AFM

 

AFM image of one of our calibration references/standards
Calibration Specimens

Length calibration specimens in the nanometer to micron range for AFM, STM, SEM, and others.

We also offer Traceable Calibration Specimens (XY length scales traceable to international standards)

Other supplies

 

Screen-shot of our DiscTrack Plus Media Measurement System
Calibration and Measurement Software

DiscTrack Plus, SPIP, and DTP Advanced Image Processor

 

Our President, Dr. Donald A. Chernoff
Training, Consulting, and Expert Services

Put our AFM experience to work for you.

 
About Advanced Surface Microscopy, Inc.
News and announcements

NanoScope Dimension Microscope
Buy and Sell used Nanoscopes

Convert your excess assets into cash or come to us for quality refurbished AFMs at bargain prices.  We buy and sell DimensionTM, MultimodeTM, and Small sample AFM and STM, Microscopes, Scanners, PC's, and Controllers (made by Bruker Nano, formerly known as Veeco Metrology and as Digital Instruments).

 
Repair your NanoScope AFM or STM

We can perform many repairs on older NanoScope Brand Atomic Force Microscopes.

Now:  Z drift repair

Repair your Veeco/Bruker Dimension Vx Atomic Force Profiler and Dimension 7000 and 9000 Atomic Force Profilers.

We can help with other Automated NanoScope brand AFMs (Dimension 7000 and Dimension 9000) and with Dimension 3100 and 5000 that also use the Veeco Metrology closed loop scanners.

 
Industries served and materials analyzed:
Atomic Force Microscopy (AFM) is an important analytical tool in science and industry.  It's one of the key metrology (measurement) tools used in Nanotechnology, in the semiconductor industry, in optical discs (CD, DVD, Blu-Ray, etc.), in magnetic media, and in many other fields.  AFM is used to analyze surface finishes and roughness, material wear, corrosion, and other surface structures.  It can be used to map material domains in polymers, crystal structures in metals, particle size and distribution, formed micro and nano-structures, structure and size of catalyst and other powders, fibers of all types, pharmaceutical materials, and many other things.  We've analyzed everything from the microroughness of superpolished optics to atomic steps on semiconductor wafers, from DNA molecules to polymer blends used in food packaging, from the sharpness of razor blades to wear patterns on piston rings and the shape of liquid droplets, from the size of nanomedicines to the track pitch variation of Blu-Ray discs.

Any surface you can touch is a potential object for study

Techniques we have available include TappingMode height and phase imaging, Scanning Tunneling Microscopy (STM), Nano indenting and scratching, Electric and Magnetic Force Microscopy (EFM and MFM), Scanning Kelvin Probe Microscopy (Surface Potential), Scanning Capacitance Microscopy (SCM), Scanning Spreading Resistance Microscopy (SSRM) and other conductive AFM techniques.

Whether you need analysis, consultation or training to use your AFM equipment better, supplies and accessories, traceable calibration standards, NanoScope equipment or equipment repairs, contact us.  We can help.

 

 

Trademark and Copyright Notice

 

Hit Counter