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Don Chernoff will speak at the Eastern Analytical Symposium in Somerset NJ.
He is an invited speaker in the symposium
entitled "Scanning Probe Microscopy - From Cells to Polymer
Science, a New Analytical Technique for the '90s". His talk
will be given on Tuesday Nov. 19, 1996 at 1:30 pm.
HIGH RESOLUTION CHEMICAL IMAGING USING THE
SCANNING PROBE MICROSCOPE, Donald A. Chernoff, Advanced Surface
Microscopy, 6009 Knyghton Road, Indianapolis, IN 46220-4955
It is challenging
and worthwhile to image the microstructure of composite surfaces
and distinguish regions of different composition. Such images
aid diverse kinds of manufacturing, engineering and research.
With 'phase imaging', the SPM can now achieve chemical imaging
with 10 nm lateral resolution. We first briefly introduce two
of the most common Scanning Probe techniques: contact mode and
AFM. Then we discuss 'phase imaging' and show several examples
of material contrast in inorganic and organic systems, including:
detection of photoresist residue on silicon; identification of
contaminant/wear particles on a magnetic recording head; growth
of corrosion films; domains on a copolymer surface; thin coatings
of lignin on cellulose; and mixed Langmuir-Blodgett films.
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