Products and services for AFM, STM, and SEM
Scanning Probe Microscopy for Materials Analysis.
Exotic curiosity or practical tool?
Litigation Support and Expert Testimony
Calibration and Measurement Software
Used Nanoscope Equipment
Repair your NanoScope AFM.
Large stock of repair parts.
Special Sale Items
Applications of AFM and STM
Naturally occurring (cellulose)
Cast, extruded, or molded polymers
CorrosionNew materials including ultra high strength magnets
Optics & Photonics
Traceable nanometer calibration specimens
How big is your piece of cake?
Accurate measurement of the size of a piece of cake may not be the most important thing in the world. Other measurements are much more important. However, the accuracy of the measurement can be no better than the accuracy of the scale. And unless the different scales agree with each other, the measurements won't agree either. To ensure that various scales agree with each other, measurements standards have been established and used to ensure that different measurement tools agree.
Measurement accuracy is also important in the microscopic realm. As dimensional tolerances for such applications as semiconductors and optical discs get tighter, the need for precision length standards at the nanometer length scales becomes more important. The sophisticated measuring tools used to measure these features, tools such as Atomic Force Microscopes and Scanning Electron Microscopes, require periodic calibration to produce accurate results. Calibration specimens with feature sizes or positions directly traceable to international length standards are key tools to producing accurate and reliable results.
Advanced Surface Microscopy's Model 292UTC, 150-2DUTC, and Model 145TC calibration specimens provides that tool. These specimens are useable with a variety of measurement tools such as Atomic Force and Scanning Electron microscopes. The specimens are traceable to the International Meter and come with a certificate stating both the mean feature spacing (pitch) and the uncertainty.
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