Contents

Products and services for AFM, STM, and SEM

Analytical Services
   Scanning Probe Microscopy for Materials Analysis.
   Exotic curiosity or practical tool?
Calibration Specimens
Consulting
Training
Litigation Support and Expert Testimony
Calibration and Measurement Software
Used Nanoscope Equipment
Repair your NanoScope AFM.
   Large stock of repair parts.
Special Sale Items
Price List

Applications of AFM and STM

Optical and Magnetic Media

   CD
   DVD
   HD-DVD
   Blu-Ray
   Hard Disks
   Magnetic Tape
   More

Biomedical

Pharmaceutical materials
     Collagen fibers
     Collagen monomers
     DNA Plasmids
   Polymer molecules
   Orthopedic implants
   Opthamalic Devices
   Diagnostic devices
   And More

Chemical Materials

   Powders

Raw Polymers

   Naturally occurring (cellulose)
   Blends
   Copolymers
   Homopolymers
   Material domains

Polymer Devices and Structures

   Paper
   Packaging materials
   Cast, extruded, or molded polymers

Coatings

   Paint
   Paper finishing
   Can coatings

Electronic Materials

   Silicon
   Silicon Carbide
   Germanium
   Gallium Arsenide
   Wafers
   Thin Films

Automotive

   Corrosion
   Wear

Energy Technologies

   Corrosion
   Calalysts

New materials including ultra high strength magnets

Optics & Photonics

   Diffraction Gratings
   Modified surfaces
   superpolished optics
   Ultrasmooth surfaces
   IR
   Visible Light
   UV
   X-Ray

Telecommunications

Metals

Gallery of interesting images

Links

AFM probes (all substrates are separated, i.e. ready for use)

All AFM probes are compatible with NanoScope equipment and most other brands

Silicon Probes for Tapping Mode in Air

• Silicon probes for Non-contact or Tapping Mode AFM (each piece has 1 cantilever), new
• Silicon AFM probes, practice grade (Learn setup and operation at lower cost. Mount particles on cantilever or tip.)
• Silicon probes are made of crystalline silicon. Cantilever characteristics vary from piece to piece, but are typically as follows: Thickness: 4 microns, Width: 28 microns, Length: 125 microns, Frequency: 270-330 KHz
• We provide convenient small quantities of probes.

Silicon Nitride probes for Contact Mode (air and liquid) and for Tapping Mode in Liquid.

• Silicon Nitride AFM probes, standard type (each piece has 4 cantilevers), new
• Silicon Nitride AFM probes, oxide-sharpened type (each piece has 4 cantilevers), new
• Silicon Nitride AFM probes, Chromium-coated, new - limited quantity
• Silicon Nitride AFM probes, practice grade (1 or more cantilevers on each piece has been used or removed)  

Tipless Probes

• Silicon Contact mode, tipless (Park Scientific/ThermoMicroscopes) Ultralevers, Model ULC-NTHW, p/n 00-103-0965.  Each probe has 4 triangular cantilevers with gold coating on back side.  Available:  half-wafer containing about 200 probes.  Call for price.
• Silicon Non-contact mode, tipless (Park Scientific/ThermoMicroscopes) Ultralevers, Model ULNC-NTNM, p/n 00-103-0976.  Each probe has 4 triangular cantilevers with gold coating on back side.  Available:  1 box containing about 5 probes.   Call for price.

Additional technical information about Silicon Nitride and Silicon AFM Probes

• Definitions:
  Substrate:  the body of the probe.
  Cantilever:  a flexible beam which extends in plane from the substrate.
  Tip:  the sharp point which protrudes vertically from the cantilever.
  Probe:  the complete object, consisting of substrate, cantilevers and tips.
  
• Typical substrate dimensions  (length, width, thickness):
  Silicon Nitride: 3.6  x 1.7 x 0.5 mm
  Silicon:  3.5 x 1.6 x 0.4 mm
  
• Tip Shape -Silicon nitride:
  Nominal tip radius of curvature: 20 - 60nm ('standard'), 5-40 nm ('oxide-sharpened')
  Overall tip shape: square pyramid with half angle (center axis to face)  35°
  

  Approximate force constants for silicon nitride cantilevers:

  

• Tip Shape - Silicon:
  Nominal tip radius of curvature: < 10nm
  Overall tip shape:  complex pyramid with nominal half angles: 
      Steep wall type:  about 17° side, 25° front, 10° back   
      Symmetric type: about 18° side, 15° front, 25° back
  Force constant: about 40 N/m
  Resonant Frequency:  about 300 kHz.

Price List
Be sure to check our list of Featured Equipment

STM probes :

Our existing stock is reserved for sale only with STM equipment. (9/26/05) The information below is given only for reference.

Probe diameter = .010" (.25 mm). Fits standard NanoScope tip holders.

• Pt-Ir NanoTips for STM, new - mechanically-formed tip, best tip for atomic-scale imaging (e.g. on HOPG). Probe length = 7-8 mm (.25" nominal length) - available for sale only with STM equipment
• Pt-Ir NanoTips for STM, used (suitable for practice or re-work) - limited quantity
• CG tips for STM - tapered geometry, etched tip with radius better than 50 nm. Best tip for nm- to micron-scale imaging. Probe length 11-12 mm.  - sold