Helping Solve Processing and Materials  Problems using Scanning Probe Microscopy since 1990.

CD stamper bumps, perspective view


Phone:  1-800-374-8557  Fax: 1-317-895-5652

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: Products and services for AFM, STM, and SEM
: Applications of AFM and STM
   : CD
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   : Corrosion
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: New materials including ultra high strength magnets
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:Gallery of interesting images




AFM probes (all substrates are separated, i.e. ready for use)

All AFM probes are compatible with NanoScope equipment and most other brands

Silicon Probes for Tapping Mode in Air

  • Silicon probes for Non-contact or Tapping Mode AFM (each piece has 1 cantilever), new
  • Silicon AFM probes, practice grade (Learn setup and operation at lower cost. Mount particles on cantilever or tip.)
  • Silicon probes are made of crystalline silicon. Cantilever characteristics vary from piece to piece, but are typically as follows: Thickness: 4 microns, Width: 28 microns, Length: 125 microns, Frequency: 270-330 KHz
  • We provide convenient small quantities of probes.

Silicon Nitride probes for Contact Mode (air and liquid) and for Tapping Mode in Liquid.

  • Silicon Nitride AFM probes, standard type (each piece has 4 cantilevers), new
  • Silicon Nitride AFM probes, oxide-sharpened type (each piece has 4 cantilevers), new
  • Silicon Nitride AFM probes, Chromium-coated, new - limited quantity
  • Silicon Nitride AFM probes, practice grade (1 or more cantilevers on each piece has been used or removed)  

Tipless Probes

  • Silicon Contact mode, tipless (Park Scientific/ThermoMicroscopes) Ultralevers, Model ULC-NTHW, p/n 00-103-0965.  Each probe has 4 triangular cantilevers with gold coating on back side.  Available:  half-wafer containing about 200 probes.  Call for price.
  • Silicon Non-contact mode, tipless (Park Scientific/ThermoMicroscopes) Ultralevers, Model ULNC-NTNM, p/n 00-103-0976.  Each probe has 4 triangular cantilevers with gold coating on back side.  Available:  1 box containing about 5 probes.   Call for price.
Price List
Need a scanner?  See our equipment list.

Additional technical information about Silicon Nitride and Silicon AFM Probes

  • Definitions:
    Substrate:  the body of the probe.
    Cantilever:  a flexible beam which extends in plane from the substrate.
    Tip:  the sharp point which protrudes vertically from the cantilever.
    Probe:  the complete object, consisting of substrate, cantilevers and tips.
  • Typical substrate dimensions  (length, width, thickness):
    Silicon Nitride: 3.6  x 1.7 x 0.5 mm
    Silicon:  3.5 x 1.6 x 0.4 mm
  • Tip Shape -Silicon nitride:
    Nominal tip radius of curvature: 20 - 60nm ('standard'), 5-40 nm ('oxide-sharpened')
    Overall tip shape: square pyramid with half angle (center axis to face)  35°

    Approximate force constants for silicon nitride cantilevers:

    silicon nitride cantilever spring constants

  • Tip Shape - Silicon:
    Nominal tip radius of curvature: < 10nm
    Overall tip shape:  complex pyramid with nominal half angles: 
        Steep wall type:
      about 17° side, 25° front, 10° back   
        Symmetric type: about 18° side, 15° front, 25° back
    Force constant: about 40 N/m
    Resonant Frequency:  about 300 kHz.

Price List
Be sure to check our list of Featured Equipment

STM probes :

Our existing stock is reserved for sale only with STM equipment. (9/26/05) The information below is given only for reference.

Probe diameter = .010" (.25 mm). Fits standard NanoScope tip holders.

  • Pt-Ir NanoTips for STM, new - mechanically-formed tip, best tip for atomic-scale imaging (e.g. on HOPG). Probe length = 7-8 mm (.25" nominal length) - available for sale only with STM equipment
  • Pt-Ir NanoTips for STM, used (suitable for practice or re-work) - limited quantity
  • CG tips for STM - tapered geometry, etched tip with radius better than 50 nm. Best tip for nm- to micron-scale imaging. Probe length 11-12 mm- sold
NOTE: PROBE LENGTH VARIES. You can cut shorter to suit your application.
Price List


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