Helping Solve Processing and Materials  Problems using Scanning Probe Microscopy since 1990.

CD stamper bumps, perspective view


Phone:  1-800-374-8557  Fax: 1-317-895-5652

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: Products and services for AFM, STM, and SEM
: Applications of AFM and STM
   : CD
   : DVD
   : HD-DVD
   : Hard Disks
   : Magnetic Tape
   : More
: Pharmaceutical materials
     : Collagen fibers
     : Collagen monomers
     : DNA Plasmids
   : Polymer molecules
   : Orthopedic implants
   : Opthamalic Devices
   : Diagnostic devices
   : And More
   : Powders
   : Naturally occurring (cellulose)
   : Blends
   : Copolymers
   : Material domains
   : Paper
   : Packaging materials
   : Cast, extruded, or molded polymers
: Coatings
   : Paint
   : Paper finishing
   : Can coatings
: Electronic Materials
   : Silicon
   : Silicon Carbide
   : Germanium
   : Gallium Arsenide
   : Wafers
   : Thin Films
: Automotive
   : Corrosion
   : Wear
: Energy Technologies
   : Corrosion
   : Calalysts
: New materials including ultra high strength magnets
: Optics & Photonics
   : Diffraction Gratings
   : Modified surfaces
   : superpolished optics
   : Ultrasmooth surfaces
   : IR
   : Visible Light
   : UV
   : X-Ray
: Telecommunications

: Metals

:Gallery of interesting images



Training, Consulting, and Expert Services

At Advanced Surface Microscopy, we make our expertise available to you in a variety of ways.

  • Training
    Atomic Force and other Scanning Probe Microscopes can provide a wealth of information.  Making the most of that information requires skilled microscope operators who understand the best ways to prepare and mount samples, to run the microscope, and to interpret images and their analyses.  Our experts can come to your lab to train your operators on your own equipment so you can get the most information for your analysis dollar.
    • We have some simple experiments that can illustrate some of the AFM's basic capabilities.
  • Consulting
    In the course of using results from a microscopy lab, questions arise, challenges need to be overcome, problems need to be solved.  Contact us for consultation to get that extra bit of expertise to carry you over rough spots in your work.
  • Expert Services
    In patent infringement and other legal matters, our ability to look at and analyze surfaces can help get to the root of the case.  As recognized experts in the field, we can testify on important details to help resolve your case.

Our expertise

Company Founder and President Donald A. Chernoff has been using Scanning Tunneling, Atomic Force, and other forms of Scanning Probe Microscopes since 1986 and is one of the pioneers in the field.  In 1990 he founded Advanced Surface Microscopy and has been specializing in these forms of microscopy ever since.

Senior Analytical Scientist David L. Burkhead first started using Scanning Tunneling and Atomic Force Microscopes in in 1996.  On graduation the next year he came to work for Advanced Surface Microscopy  where he has been involved in Atomic Force Microscopy ever since.

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